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Analog fault diagnosis using S-transform preprocessor and a QNN classifier
Tan, Yanghong, Sun, Yichuang, Yin, XinVolume:
46
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2013.03.002
Date:
August, 2013
File:
PDF, 1.60 MB
english, 2013