SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing - Influence of the size dispersion on the emission spectra of the hydrogen passivated Si nanoparticles in SiNx

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