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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Next-Generation Spectroscopic Technologies V - Simple XRD algorithm for direct determination of cotton crystallinity
Liu, Yongliang, Druy, Mark A., Crocombe, Richard A., Thibodeaux, Devron, Gamble, Gary, Bauer, Philip, VanDerveer, DonVolume:
8374
Year:
2012
Language:
english
DOI:
10.1117/12.918628
File:
PDF, 231 KB
english, 2012