[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Defect Coverage-Driven Window-Based Test Compression
Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Kalligeros, Emmanouil, Tenentes, VasileiosYear:
2010
Language:
english
DOI:
10.1109/ATS.2010.33
File:
PDF, 406 KB
english, 2010