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[IEEE TENCON 2008 - 2008 IEEE Region 10 Conference (TENCON) - Hyderabad, India (2008.11.19-2008.11.21)] TENCON 2008 - 2008 IEEE Region 10 Conference - Detection of abnormalities and electricity theft using genetic Support Vector Machines
Nagi, J., Yap, K. S., Tiong, S. K., Ahmed, S. K., Mohammad, A. M.Year:
2008
Language:
english
DOI:
10.1109/TENCON.2008.4766403
File:
PDF, 1.04 MB
english, 2008