Direct characterization of spin-transfer switching of nano-scale magnetic tunnel junctions using a conductive atomic force microscope
Lee, Jia-Mou, Yang, Dong-Chin, Lee, Ching-Ming, Ye, Lin-Xiu, Chang, Yao-Jen, Lee, Yen-Chi, Wu, Jong-Ching, Wu, Te-hoVolume:
46
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/46/17/175002
Date:
May, 2013
File:
PDF, 438 KB
english, 2013