A Microscopic Analysis of the Carrier–Velocity Distribution...

physica status solidi (b) 1997 Vol. 204; Iss. 1

A Microscopic Analysis of the Carrier–Velocity Distribution and the Noise in FET Devices

P. Houlet, H. Ueno, C. Hamaguchi, J. C. Vaissiere, J. P. Nougier, L. Varani
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Volume:
204
Year:
1997
Language:
english
Pages:
3
DOI:
10.1002/1521-3951(199711)204:13.0.co;2-z
File:
PDF, 140 KB
english, 1997
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