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An extended defect as a sensor for free carrier diffusion...

An extended defect as a sensor for free carrier diffusion in a semiconductor

Gfroerer, T. H., Zhang, Yong, Wanlass, M. W.
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Volume:
102
Year:
2013
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4775369
File:
PDF, 782 KB
english, 2013
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