Characterizing the Ultrafast Charge Carrier Trapping Dynamics in Single ZnO Rods Using Two-Photon Emission Microscopy
House, Ralph L., Mehl, Brian P., Kirschbrown, Justin R., Barnes, Scott C., Papanikolas, John M.Volume:
115
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp1118426
Date:
June, 2011
File:
PDF, 1.05 MB
english, 2011