Surface recombination velocity measurements at the siliconâsilicon dioxide interface by microwave-detected photoconductance decay
Stephens, A. W., Aberle, A. G., Green, M. A.Volume:
76
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.357082
File:
PDF, 1.22 MB
english, 1994