Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced dc magnetic field sensitivity
Dréau, A., Lesik, M., Rondin, L., Spinicelli, P., Arcizet, O., Roch, J.-F., Jacques, V.Volume:
84
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.84.195204
Date:
November, 2011
File:
PDF, 997 KB
english, 2011