RF capacitance-voltage characterization of MOSFETs with...

IEEE Electron Device Letters 2003 / 01 Vol. 24; Iss. 1

RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics

Schmitz, J., Cubaynes, F.N., Havens, R.J., de Kort, R., Scholten, A.J., Tiemeijer, L.F.
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Volume:
24
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2002.807016
Date:
January, 2003
File:
PDF, 259 KB
english, 2003
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