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Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating
Kimura, Mutsumi, Inoue, Satoshi, Shimoda, Tatsuya, Tam, Simon W.-B., Lui, O. K. Basil, Migliorato, Piero, Nozawa, RyoichiVolume:
91
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1446238
File:
PDF, 305 KB
english, 2002