A Spectroscopic Ellipsometry Study of TiO 2 Thin Films Prepared by dc Reactive Magnetron Sputtering: Annealing Temperature Effect
Horprathum, Mati, Chindaudom, Pongpan, Limsuwan, PichetVolume:
24
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/24/6/021
Date:
June, 2007
File:
PDF, 438 KB
english, 2007