A Spectroscopic Ellipsometry Study of TiO 2...

A Spectroscopic Ellipsometry Study of TiO 2 Thin Films Prepared by dc Reactive Magnetron Sputtering: Annealing Temperature Effect

Horprathum, Mati, Chindaudom, Pongpan, Limsuwan, Pichet
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Volume:
24
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/24/6/021
Date:
June, 2007
File:
PDF, 438 KB
english, 2007
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