Thickness dependence of the switching voltage in all-oxide...

Thickness dependence of the switching voltage in all-oxide ferroelectric thin-film capacitors prepared by pulsed laser deposition

Cillessen, J. F. M., Prins, M. W. J., Wolf, R. M.
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Volume:
81
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.363961
File:
PDF, 373 KB
english, 1997
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