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Fitting Full X-Ray Diffraction Patterns for Quantitative Analysis: A Method for Readily Quantifying Crystalline and Disordered Phases
Chipera, Steve J., Bish, David L.Volume:
3
Year:
2013
Language:
english
Journal:
Advances in Materials Physics and Chemistry
DOI:
10.4236/ampc.2013.31A007
File:
PDF, 512 KB
english, 2013