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IEEE Design & Test of Computers 2011

Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits

Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, Mohammad
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Year:
2011
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/MDT.2010.114
File:
PDF, 220 KB
english, 2011
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