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All-Amorphous-Oxide Transparent, Flexible Thin-Film Transistors. Efficacy of Bilayer Gate Dielectrics
Liu, Jun, Buchholz, D. Bruce, Hennek, Jonathan W., Chang, Robert P. H., Facchetti, Antonio, Marks, Tobin J.Volume:
132
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja9103155
Date:
September, 2010
File:
PDF, 4.94 MB
english, 2010