TEM Studies of Cu2O-Si and Cu2O-InP Interfaces Made by...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

TEM Studies of Cu2O-Si and Cu2O-InP Interfaces Made by Epitaxial Electrodeposition

Oba, Fumiyasu, Liu, Run, Yu, Yeonseop, Bohannan, E W, Ernst, Frank, Switzer, Jay
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927604884617
Date:
August, 2004
File:
PDF, 693 KB
english, 2004
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