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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Test and Measurement Applications of Optoelectronic Devices - Beam shaping of broad-area diode lasers: principles and benefits
Pfeil, Albrecht v., von Freyhold, Thilo, Chin, Aland K., Dutta, Niloy K., Herrick, Robert W., Linden, Kurt J., McGraw, Daniel J.Volume:
4648
Year:
2002
Language:
english
DOI:
10.1117/12.462645
File:
PDF, 1000 KB
english, 2002