Depth profiling by ion microprobe with high mass resolution

Depth profiling by ion microprobe with high mass resolution

F. Degrève, R. Figaret, P. Laty
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Volume:
29
Year:
1979
Language:
english
Pages:
11
DOI:
10.1016/0020-7381(79)80005-4
File:
PDF, 618 KB
english, 1979
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