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[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems
Nicolaidis, Michael, Pasca, Vladimir, Anghel, LorenaYear:
2011
Language:
english
DOI:
10.1109/ETS.2011.37
File:
PDF, 118 KB
english, 2011