Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride
Simpkins, B. S., Yu, E. T., Waltereit, P., Speck, J. S.Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1586952
File:
PDF, 1.04 MB
english, 2003