Correlated scanning Kelvin probe and conductive atomic...

Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride

Simpkins, B. S., Yu, E. T., Waltereit, P., Speck, J. S.
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Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1586952
File:
PDF, 1.04 MB
english, 2003
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