Reflectivity study of hexagonal GaN films grown on GaAs: Surface roughness, interface layer, and refractive index
Shokhovets, S., Goldhahn, R., Cimalla, V., Cheng, T. S., Foxon, C. T.Volume:
84
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.368223
File:
PDF, 457 KB
english, 1998