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Characterization of graphene layers by Kelvin probe force microscopy and micro-Raman spectroscopy
Nazarov, A. N., Gordienko, S. O., Lytvyn, P. M., Strelchuk, V. V., Nikolenko, A. S., Vasin, A. V., Rusavsky, A. V., Lysenko, V. S., Popov, V. P.Volume:
10
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201200918
Date:
August, 2013
File:
PDF, 346 KB
english, 2013