Robust surface electronic properties of topological insulators: Bi[sub 2]Te[sub 3] films grown by molecular beam epitaxy
Plucinski, L., Mussler, G., Krumrain, J., Herdt, A., Suga, S., GruÌtzmacher, D., Schneider, C. M.Volume:
98
Year:
2011
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3595309
File:
PDF, 1.24 MB
english, 2011