Atom Probe Tomography Characterization of Thin Copper...

Atom Probe Tomography Characterization of Thin Copper Layers on Aluminum Deposited by Galvanic Displacement

Zhang, Yi, Ai, Jiahe, Hillier, Andrew C., Hebert, Kurt R.
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Volume:
28
Language:
english
Journal:
Langmuir
DOI:
10.1021/la204156d
Date:
January, 2012
File:
PDF, 2.50 MB
english, 2012
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