Trap densities in amorphous-InGaZnO[sub 4] thin-film transistors
Kimura, Mutsumi, Nakanishi, Takashi, Nomura, Kenji, Kamiya, Toshio, Hosono, HideoVolume:
92
Year:
2008
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2904704
File:
PDF, 505 KB
english, 2008