SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - Characterization of the critical behavior of Ising thin films
Marques, Manuel I., Gonzalo, Julio A., Romero, Juan, Fonesca, Luis F., Chu, Junhao, Liu, Pulin, Chang, YongVolume:
4086
Year:
2000
Language:
english
DOI:
10.1117/12.408405
File:
PDF, 419 KB
english, 2000