In Situ TEM Near-Field Optical Probing of...

Nano Letters 2012 / 05 Vol. 12; Iss. 5

In Situ TEM Near-Field Optical Probing of Nanoscale Silicon Crystallization

Xiang, Bin, Hwang, David J., In, Jung Bin, Ryu, Sang-Gil, Yoo, Jae-Hyuck, Dubon, Oscar, Minor, Andrew M., Grigoropoulos, Costas P.
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Volume:
12
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl3007352
Date:
May, 2012
File:
PDF, 1.51 MB
english, 2012
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