Reliability Characterization Issues for Nanoscale Flash...

IEEE Transactions on Device and Materials Reliability 2013 / 06 Vol. 13; Iss. 2

Reliability Characterization Issues for Nanoscale Flash Memories: A Case Study on 45-nm NOR Devices

Miccoli, Carmine, Monzio Compagnoni, Christian, Chiavarone, Luca, Beltrami, Silvia, Lacaita, Andrea L., Spinelli, Alessandro S., Visconti, Angelo
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2252619
Date:
June, 2013
File:
PDF, 1.39 MB
english, 2013
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