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Characterization of surface stiffness and probe–sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis
Kareem, Adam U, Solares, Santiago DVolume:
23
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/23/1/015706
Date:
January, 2012
File:
PDF, 2.18 MB
english, 2012