Review and Analysis of the Radiation-Induced Degradation...

IEEE Transactions on Nuclear Science 2008 / 12 Vol. 55; Iss. 6

Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated Circuits

Dusseau, Laurent, Bernard, Muriel, Boch, JÉrÔme, Gonzalez Velo, Yago, Roche, Nicolas, Lorfevre, Eric, Bezerra, FranÇoise, Calvel, Philippe, Marec, Ronan, Saigne, FrÉdÉric
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Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2008.2006835
Date:
December, 2008
File:
PDF, 1.06 MB
english, 2008
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