Pulsed-laser testing methodology for single event...

IEEE Transactions on Nuclear Science 2004 / 12 Vol. 51; Iss. 6

Pulsed-laser testing methodology for single event transients in linear devices

Buchner, S., Howard, J., Poivey, C., McMorrow, D., Pease, R.
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Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2004.839263
Date:
December, 2004
File:
PDF, 730 KB
english, 2004
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