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ULTRAFAST ELECTRON DIFFRACTIVE VOLTAMMETRY: GENERAL FORMALISM AND APPLICATIONS
CHANG, KISEOK, MURDICK, RYAN A., TAO, ZHEN-SHENG, HAN, TZONG-RU T., RUAN, CHONG-YUVolume:
25
Language:
english
Journal:
Modern Physics Letters B
DOI:
10.1142/S0217984911027492
Date:
October, 2011
File:
PDF, 912 KB
english, 2011