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Moving Toward Nano-TCAD Through Multimillion-Atom Quantum-Dot Simulations Matching Experimental Data
Usman, M., Hoon Ryu,, Insoo Woo,, Ebert, D.S., Klimeck, G.Volume:
8
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2008.2011900
Date:
May, 2009
File:
PDF, 1.38 MB
english, 2009