![](/img/cover-not-exists.png)
Inferring Process from Pattern in Plant Invasions: A Semimechanistic Model Incorporating Propagule Pressure and Environmental Factors.
Rouget, Mathieu, Richardson, David M.Volume:
162
Language:
english
Journal:
The American Naturalist
DOI:
10.1086/379204
Date:
December, 2003
File:
PDF, 373 KB
english, 2003