Inferring Process from Pattern in Plant Invasions: A...

Inferring Process from Pattern in Plant Invasions: A Semimechanistic Model Incorporating Propagule Pressure and Environmental Factors.

Rouget, Mathieu, Richardson, David M.
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Volume:
162
Language:
english
Journal:
The American Naturalist
DOI:
10.1086/379204
Date:
December, 2003
File:
PDF, 373 KB
english, 2003
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