Direct analysis of silicon carbide by fluorination assisted...

Direct analysis of silicon carbide by fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a slurry sampling technique

Peng, Tianyou, Sheng, Xiaohai, Hu, Bin, Jiang, Zucheng
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Volume:
125
Year:
2000
Language:
english
Journal:
The Analyst
DOI:
10.1039/b006441f
File:
PDF, 103 KB
english, 2000
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