Direct analysis of silicon carbide by fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a slurry sampling technique
Peng, Tianyou, Sheng, Xiaohai, Hu, Bin, Jiang, ZuchengVolume:
125
Year:
2000
Language:
english
Journal:
The Analyst
DOI:
10.1039/b006441f
File:
PDF, 103 KB
english, 2000