Atomic and Electronic Structures of Traps in Silicon Oxide...

Critical Reviews in Solid State and Material Sciences 2011 / 07 Vol. 36; Iss. 3

Atomic and Electronic Structures of Traps in Silicon Oxide and Silicon Oxynitride

Gritsenko, Vladimir, Wong, Hei
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Volume:
36
Language:
english
Journal:
Critical Reviews in Solid State and Materials Sciences
DOI:
10.1080/10408436.2011.592622
Date:
July, 2011
File:
PDF, 1.39 MB
english, 2011
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