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SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Use of a scanning optical profilometer for toolmark characterization
Chumbley, L. S., Postek, Michael T., Newbury, Dale E., Eisenmann, D. J., Morris, M., Platek, S. Frank, Joy, David C., Zhang, S., Craft, J., Fisher, C., Saxton, A.Volume:
7378
Year:
2009
Language:
english
DOI:
10.1117/12.825185
File:
PDF, 398 KB
english, 2009