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SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Forensic document analysis using scanning microscopy
Shaffer, Douglas K., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C.Volume:
7378
Year:
2009
Language:
english
DOI:
10.1117/12.825186
File:
PDF, 2.09 MB
english, 2009