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X-ray diffraction and electron spectroscopy of epitaxial molecular Buckminsterfullerene films
Tong, William M., Ohlberg, Douglas A. A., You, Hong K., Williams, R. Stanley, Anz, Samir J., Alvarez, Marcos M., Whetten, Robert L., Rubin, Yves, Diederich, Francois N.Volume:
95
Language:
english
Journal:
The Journal of Physical Chemistry
DOI:
10.1021/j100165a022
Date:
June, 1991
File:
PDF, 472 KB
english, 1991