Time-resolved spatially offset Raman spectroscopy for depth analysis of diffusely scattering layers
Iping Petterson, Ingeborg E., Dvořák, Patrick, Buijs, Joost B., Gooijer, Cees, Ariese, FreekVolume:
135
Year:
2010
Language:
english
Journal:
The Analyst
DOI:
10.1039/c0an00611d
File:
PDF, 239 KB
english, 2010