Electrically conducting, ultra-sharp, high aspect-ratio...

Ultramicroscopy 2013 / 10 Vol. 133

Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinum

Brown, Jason, Kocher, Paul, Ramanujan, Chandra S, Sharp, David N, Torimitsu, Keiichi, Ryan, John F
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Volume:
133
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2013.05.005
Date:
October, 2013
File:
PDF, 2.58 MB
english, 2013
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