![](/img/cover-not-exists.png)
[NATO Science Series II: Mathematics, Physics and Chemistry] Defects in High-k Gate Dielectric Stacks Volume 220 ||
Gusev, EvgeniVolume:
10.1007/1-
Year:
2006
Language:
english
DOI:
10.1007/1-4020-4367-8
File:
PDF, 41.16 MB
english, 2006