An experimental method to evaluate the dead Layer thickness of X- and gamma-ray semiconductor detectors
Dusi, W., Donati, A., Landini, G., Perillo, E., Raulo, A., Ventura, G., Vitulli, S.Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2004.839098
Date:
December, 2004
File:
PDF, 308 KB
english, 2004