[IEEE 2010 IEEE 21st International Symposium on Software Reliability Engineering (ISSRE) - San Jose, CA, USA (2010.11.1-2010.11.4)] 2010 IEEE 21st International Symposium on Software Reliability Engineering - Automatic Mutation Test Case Generation via Dynamic Symbolic Execution
Papadakis, Mike, Malevris, NicosYear:
2010
Language:
english
DOI:
10.1109/ISSRE.2010.38
File:
PDF, 401 KB
english, 2010