Determination of Si δ-Doping Concentration in GaN by Electroreflectance
A. Drabińska, K.P. Korona, R. Bożek, A. Babiński, J.M. Baranowski, W. Pacuski, R. Stȩpniewski, T. TomaszewiczVolume:
234
Year:
2002
Language:
english
Pages:
4
DOI:
10.1002/1521-3951(200212)234:33.0.co;2-h
File:
PDF, 132 KB
english, 2002