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[IEEE 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) - Hakone-Machi, Kanagawa (2008.09.9-2008.09.11)] 2008 International Conference on Simulation of Semiconductor Processes and Devices - A robust parallel delaunay mesh generation approach suitable for three-dimensional TCAD
Stimpfl, Franz, Heinzl, Rene, Schwaha, Philipp, Selberherr, SiegfriedYear:
2008
Language:
english
DOI:
10.1109/SISPAD.2008.4648288
File:
PDF, 968 KB
english, 2008