Lifetime Data: Models in Reliability and Survival Analysis...

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Lifetime Data: Models in Reliability and Survival Analysis || Models for Degradation Processes and Event Times Based on Gaussian Processes

Jewell, Nicholas P., Kimber, Alan C., Lee, Mei-Ling Ting, Whitmore, G. A.
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Volume:
10.1007/97
Year:
1996
Language:
english
DOI:
10.1007/978-1-4757-5654-8_13
File:
PDF, 736 KB
english, 1996
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